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Laboratory setup and configuration requirements
- Publication Part Number: 8510119300
- Created: 23 May 2022
- 974 KB
Low-ppt determination of alkali metals in high matrix samples using the optional "m-lens"
- Publication Part Number: 5994-0383EN
- Created: 15 Nov 2018
- 935 KB
| Chinese (Simplified) (China) | Complete (PDF) |
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Online MSA calibration using prepFAST S automated sample introduction and Agilent 8900 ICP-QQQ
- Publication Part Number: 5991-9487EN
- Created: 06 June 2018
- 548 KB
| Chinese (Simplified) (China) | Complete (PDF) |
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Illustrates the advanced analytical performance and robustness of the Agilent 7700s/7900 ICP-MS for the direct determination of metallic impurities in high purity concentrated HCl.
- Publication Part Number: 5990-7354EN
- Created: 02 Oct 2017
- 447 KB
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| Chinese (Simplified) (China) | Complete (PDF) |
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The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis. Learn how SVDV works with unique Dichroic Spectral combiner technology.
- Created: 06 Nov 2015
- 575 KB
Agilent’s Fitted Background Correction (FBC) takes the guesswork out of background correction. No matter what your sample challenge may be.
- Created: 06 Nov 2015
- 409 KB
Learn about the Agilent range of AA, MP-AES, ICP-OES, ICP-MS and ICP-QQQ instruments
- Publication Part Number: 5990-6443ITE
- Created: 21 July 2021
- 465 KB
| Russian (Russia) | Complete (PDF) |
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| Russian (Russia) | Complete (PDF) |
Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run
- Publication Part Number: 5994-0987JAJP
- Created: 27 June 2019
- 1 MB
| Chinese (Simplified) (China) | Complete (PDF) |
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半導(dǎo)體級 H2O2 中超痕量元素雜質(zhì)的測定
- Publication Part Number: 5991-7701ZHCN
- Created: 19 Apr 2019
- 383 KB
使用 MS/MS 模式分析 HCl 中的 50 種元素來解決多原子干擾問題。所有分析物都可直接在未稀釋的 HCl 中測定,檢測限可達(dá)到個位數(shù) ppt 級。
- Publication Part Number: 5991-8675ZHCN
- Created: 19 Apr 2019
- 467 KB
通過串聯(lián)四極桿 ICP-MS (ICP-QQQ) 直接分析未稀釋的 HNO3 中亞 ppt 至 ppt 水平的 49 種元素。
- Publication Part Number: 5991-8798ZHCN
- Created: 19 Apr 2019
- 476 KB
48 種元素的檢測限都達(dá)到了個位數(shù) ppt 級或在亞 ppt 范圍內(nèi),表明 7700s/7900 能夠?qū)哿课廴疚镞M(jìn)行常規(guī)測量。
- Publication Part Number: 5990-7914ZHCN
- Created: 04 Apr 2019
- 651 KB
| Publication Part Number | 5990-7914EN | ||
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The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis. Learn how SVDV works with unique Dichroic Spectral combiner technology.
- Publication Part Number: 5991-4853RU
- Created: 06 Nov 2015
- 94 KB
安捷倫 OneNeb 霧化器——更高的靈敏度,極低的堵塞率
- Publication Part Number: 5991-0131CHCN
- Created: 10 Apr 2012
- 3 MB
Agilent 5100 同步垂直雙向觀測 (SVDV) ICP-OES 顛覆了傳統(tǒng)雙向觀測 ICP-OES概念。5100 SVDV ICP-OES 憑借獨特的智能光譜組合技術(shù) (DSC) 一次測量完成水平和垂直信號的同步采集讀取,實現(xiàn)高速高效的樣品分析,確保復(fù)雜基質(zhì)樣品的分析準(zhǔn)確度。
- Created: 03 July 2014
- 995 KB
The Agilent 5100 SVDV ICP-OES is the fastest ICP-OES...ever. With DSC technology and vertical torch, the 5100 handles your toughest samples with speed and ease.
- Publication Part Number: 5991-4835RU
- Created: 01 July 2014
- 691 KB
| French (France) | Complete (PDF) |
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The Agilent 5100 SVDV ICP-OES is the fastest ICP-OES...ever. With DSC technology and vertical torch, the 5100 handles your toughest samples with speed and ease.
- Created: 01 July 2014
- 676 KB