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Metallic impurities in trichlorosilane (TCS), an intermediate product used in the production of photovoltaic (PV) silicon, must be strictly controlled in order to produce...
- Publication Part Number: 5990-8175EN
- Created: 20 Sep 2021
- 427 KB
| Chinese (Simplified) (China) | Complete (PDF) |
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Illustrates the advanced analytical performance and robustness of the Agilent 7700s/7900 ICP-MS for the direct determination of metallic impurities in high purity concentrated HCl.
- Publication Part Number: 5990-7354EN
- Created: 02 Oct 2017
- 447 KB
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| Chinese (Simplified) (China) | Complete (PDF) |
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Learn the reasons why the Agilent 7900s single quadrupole ICP-MS is ideal for measuring contaminants in semiconductor manufacturing chemicals
- Publication Part Number: 5994-1840EN
- Created: 29 July 2020
- 356 KB
Learn about the Agilent range of AA, MP-AES, ICP-OES, ICP-MS and ICP-QQQ instruments
- Publication Part Number: 5990-6443ITE
- Created: 21 July 2021
- 465 KB
| Russian (Russia) | Complete (PDF) |
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| Russian (Russia) | Complete (PDF) |