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Application note for measuring the optical properties of photovoltaic cells using the Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500.
| Chinese (Simplified) (China) | Complete (PDF) |
|---|
Application note for investigating the angular dependence of absolute specular reflection using the Agilent Cary 7000 UMS.
| Japanese (Japan) | Complete (PDF) |
|---|---|
| Korean (Korea) | Complete (PDF) |
| Chinese (Simplified) (China) | Complete (PDF) |
Application note for a faster, more accurate way of characterizing cube beamsplitters using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS).
| Japanese (Japan) | Complete (PDF) |
|---|---|
| Chinese (Simplified) (China) | Complete (PDF) |
| Korean (Korea) | Complete (PDF) |
Application note for Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spe
| Japanese (Japan) | Complete (PDF) |
|---|---|
| Korean (Korea) | Complete (PDF) |
Application note for the detection of trace contamination on metal surfaces using the handheld Agilent 4100 ExoScan FTIR
Application note for Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
Application note for measuring the optical properties of photovoltaic cells using the Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Application note for the deep ultraviolet spectroscopic properties of a next-generation photoresist