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Metallic impurities in trichlorosilane (TCS), an intermediate product used in the production of photovoltaic (PV) silicon, must be strictly controlled in order to produce...
| Chinese (Simplified) (China) | Complete (PDF) |
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Illustrates the advanced analytical performance and robustness of the Agilent 7700s/7900 ICP-MS for the direct determination of metallic impurities in high purity concentrated HCl.
| Publication Part Number | 5990-7354EN | ||
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| Chinese (Simplified) (China) | Complete (PDF) |
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This technology brief describes the advantages that Agilent ICP-MS instruments offer for elemental analysis in the semiconductor industry.
Learn the reasons why the Agilent 7900s single quadrupole ICP-MS is ideal for measuring contaminants in semiconductor manufacturing chemicals
Innovative technology and a new MassHunter software platform combine to make the Agilent 7900 the world’s most powerful, and most automated quadrupole ICP-MS ever. Learn more
| German (Germany) | Complete (PDF) |
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Learn about the Agilent range of AA, MP-AES, ICP-OES, ICP-MS and ICP-QQQ instruments
| French (France) | Complete (PDF) |
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| Russian (Russia) | Complete (PDF) |
| Russian (Russia) | Complete (PDF) |
48 種元素的檢測限都達(dá)到了個(gè)位數(shù) ppt 級或在亞 ppt 范圍內(nèi)，表明 7700s/7900 能夠?qū)哿课廴疚镞M(jìn)行常規(guī)測量。
| Publication Part Number | 5990-7914EN | ||
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