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This application note demonstrates the benefits of combining helium collision mode and discrete sampling to develop and validate an easy-to-use, polyatomic interference-free method for the determination of 13 elements in tea infusion.
| Publication Part Number | 5991-3252EN | |||
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| Chinese (Simplified) (United States) | Complete (PDF) |
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| Chinese (Simplified) (China) | Complete (PDF) |
| Chinese (Simplified) (United States) | Complete (PDF) |
| Japanese (Japan) | Complete (PDF) |
Application note for the analysis of Chinese herbal medicines by microwave plasma-atomic emission spectrometry (MP-AES)
| Publication Part Number | 5990-9791EN | ||
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| Portuguese (Brazil) | Complete (PDF) |
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| Russian (Russia) | Complete (PDF) |
| Chinese (Simplified) (China) | Complete (PDF) |
Application note for Determination of major and minor elements in geological samples using the 4200 MP-AES
| Publication Part Number | 5991-3772EN | ||
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| Analysis | Analysed with Part No. |
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| Chinese (Simplified) (China) | Complete (PDF) |
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Application note for Multi-element analysis of crude oil samples by ICP-MS
| Publication Part Number | 5991-3538EN | ||
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| Analysis | Analysed with Part No. |
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Ultra-fast ICP-OES determinations of base metals in geochemical samples using next generation sample introduction technology
| Publication Part Number | 5991-0876EN | ||
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Application note for Direct analysis of Cr, Ni, Pb and V in ethanol fuel by Microwave Plasma-Atomic Emission Spectrometry
| Publication Part Number | 5991-0771EN | ||
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| Analysis | Analysed with Part No. |
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| Portuguese (Brazil) | Complete (PDF) |
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| Japanese (Japan) | Complete (PDF) |
| Chinese (Simplified) (China) | Complete (PDF) |
Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
| Publication Part Number | 5990-6195EN | ||
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